4N aluminium (99.99 %)
The standard grade for general power-module ribbon. Good conductivity, low hardness and a well-understood process window on aluminium-metallised chips and nickel- or copper-plated substrates.
Aluminium bonding ribbon is a thin, flat strip of high-purity aluminium that is ultrasonically wedge-bonded to connect power chips, substrates and terminals inside a power module. One ribbon can carry the current of two or more heavy round wires, with a lower loop profile and a larger bonded area. This guide explains sizes, grades, selection and reliability testing, and how to specify ribbon when you buy it from Metline.

Bonding ribbon is the flat cousin of heavy bonding wire. Instead of a round cross-section, it has a rectangular one, typically 0.5 – 2 mm wide and 0.1 – 0.3 mm thick. It is fed from a spool through a ribbon wedge bonder, which presses it onto a pad and applies ultrasonic vibration to form a solid-state weld without melting.
Inside an IGBT, SiC MOSFET or diode module, the semiconductor chips sit on a ceramic substrate (DBC or AMB) with copper tracks. The top side of each chip still has to be connected to the circuit, and for most of the last four decades that link has been made with several parallel aluminium wires of 300 – 500 µm diameter. Ribbon does the same job with fewer, wider bonds.
Because the flat ribbon lies close to the chip surface, it spreads current over a larger contact footprint, produces a lower loop, and sees less bending stress at the heel of each bond during temperature cycling. These are the reasons ribbon has moved from niche to mainstream in automotive traction inverters, solar and wind inverters and high-power industrial drives.
Ribbon is not automatically better than wire. Each geometry has a place, and many modules use both: ribbon on the main power path and wire for gate and sense connections.
| Factor | Heavy round wire (100 – 500 µm) | Flat ribbon |
|---|---|---|
| Current per bond | Limited by diameter; several wires run in parallel | One ribbon often replaces 2 – 4 heavy wires |
| Bond footprint | Narrow, elongated wedge | Wide, flat contact spreading current across the pad |
| Loop height | Higher loops needed to avoid heel stress | Lower loop; better for thin packages |
| Inductance at high frequency | Higher for an equal cross-section | Lower, owing to the flat geometry |
| Routing flexibility | High; easy to change direction and pitch | Lower; ribbon must be bonded in a straight line between pads |
| Pad size needed | Can bond small pads | Requires pads wide enough for the ribbon |
| Equipment | Standard heavy-wire wedge bonder | Ribbon-capable bonder head, tool and guide |
| Thermal-cycling life | Proven baseline | Studies report longer life at the heel for comparable cross-sections |
If you are still comparing round wire and ribbon, read our aluminium bonding wire guide alongside this page, and the wire bonding vs ribbon bonding article for a process-level comparison.
Ribbon for power devices is almost always made from very pure aluminium, because purity keeps the metal soft. A soft ribbon deforms readily under the bonding tool, so less ultrasonic energy and force are needed, and the risk of cratering the silicon or SiC chip underneath is reduced.
The standard grade for general power-module ribbon. Good conductivity, low hardness and a well-understood process window on aluminium-metallised chips and nickel- or copper-plated substrates.
Tighter impurity control for the softest ribbon and the most consistent bond formation. Chosen where chips are thin or fragile and where qualification data must be reproducible lot to lot.
Small additions (for example a few tens of ppm of nickel, or magnesium) raise recrystallisation resistance and slow grain coarsening at high junction temperatures, which can extend power-cycling life. Composition is agreed per specification.
A copper core with an aluminium outer layer. Copper carries more current and has a lower expansion coefficient, while the aluminium skin keeps the bond compatible with aluminium chip metallisation. Used where pure aluminium reaches its limit.
Ribbon is supplied annealed to a target breaking load and elongation. Softer ribbon bonds more gently; slightly harder ribbon holds its loop shape better over long spans.
Clean, oxide-controlled, free of lubricant residue and burrs. Edge quality matters: a burr can snag in the guide or tear during looping.
Ribbon is specified by width and thickness, quoted in millimetres or in mil (thousandths of an inch). The table lists representative sizes with their cross-sectional area, the calculated DC resistance per metre for high-purity aluminium at 20 °C, and how many round heavy wires of 500 µm or 380 µm the same area equals. Resistance is calculated from geometry and the resistivity of pure aluminium (about 2.65 µΩ·cm); it is a guide, not a guaranteed value.
| Width × thickness (mm) | Approx. (mil) | Area (mm²) | DC resistance (mΩ/m) | = 500 µm wires | = 380 µm wires |
|---|---|---|---|---|---|
| 0.50 × 0.10 | 20 × 4 | 0.050 | 530 | 0.3 | 0.4 |
| 0.75 × 0.10 | 30 × 4 | 0.075 | 353 | 0.4 | 0.7 |
| 1.00 × 0.10 | 39 × 4 | 0.100 | 265 | 0.5 | 0.9 |
| 1.00 × 0.15 | 39 × 6 | 0.150 | 177 | 0.8 | 1.3 |
| 1.50 × 0.10 | 59 × 4 | 0.150 | 177 | 0.8 | 1.3 |
| 1.50 × 0.15 | 59 × 6 | 0.225 | 118 | 1.1 | 2.0 |
| 2.00 × 0.15 | 79 × 6 | 0.300 | 88 | 1.5 | 2.6 |
| 2.00 × 0.20 | 79 × 8 | 0.400 | 66 | 2.0 | 3.5 |
| 2.00 × 0.25 | 79 × 10 | 0.500 | 53 | 2.5 | 4.4 |
| 2.00 × 0.30 | 79 × 12 | 0.600 | 44 | 3.1 | 5.3 |
Breaking load and elongation depend on size, purity and temper. They are set by the purchase specification and reported for each spool, so no fixed values are given here.
Ribbon bonding is a room-temperature, solid-state process. The bonder clamps the ribbon under a grooved wedge tool, applies a controlled normal force, and vibrates the tool at ultrasonic frequency parallel to the bond surface. The vibration breaks up the oxide films on the ribbon and pad, and the clean metal surfaces form a metallurgical bond. The head then forms a loop to the second pad, makes the second bond, and cuts the ribbon.
The key process variables are bond force, ultrasonic power, bond time and touchdown parameters. Too little energy gives weak or partly bonded interfaces that fail in pull testing; too much over-deforms the ribbon, thins the heel and can damage the chip. The usual metallisations are aluminium alloy on the chip and nickel, nickel-gold or bare copper on the substrate side.
The thin section where the ribbon leaves the bond is the most stressed point during thermal cycling. Loop geometry and ribbon softness both influence heel life.
Cracks that start at the edge of the bond and grow along the interface. This is the classic wear-out mechanism of aluminium interconnects under power cycling, driven by the expansion mismatch between aluminium and silicon or SiC.
Excess force or energy can crack the die or damage the metallisation stack. Process windows are set on test chips before production.
Ribbon quality is controlled at two levels: the incoming material and the finished bond. On the material, buyers usually specify width, thickness, breaking load, elongation, surface cleanliness, edge quality and winding. On the bond, the module maker runs its own tests.
| Test | What it shows | Common reference |
|---|---|---|
| Pull test | Bond and loop strength; failure location (heel, bond, ribbon) | MIL-STD-883 Method 2011; DVS 2811 |
| Shear test | Strength of the bonded interface | DVS 2811; JEDEC JESD22-B116 (concepts for wire bonds) |
| Cross-section | Bond deformation, interface quality, any chip cracks | Internal procedure |
| Power cycling | Wear-out life of the interconnect under real heating | AQG 324 (automotive power modules) |
| Thermal shock / cycling | Robustness against package-level temperature swings | AQG 324; JEDEC JESD22-A104 |
A useful practice is to release a ribbon specification only after a complete qualification on the target module, and then to lock the material grade, temper and dimensions so that any later source change is treated as a formal requalification.
It connects the top side of power semiconductor chips (IGBTs, SiC MOSFETs, diodes) to substrate tracks and terminals inside power modules. It is chosen where currents are high and a single flat ribbon can replace several heavy round wires.
It depends on cross-section. A 2.0 × 0.2 mm ribbon has an area of 0.40 mm², about twice that of a 500 µm wire and about 3.5 times that of a 380 µm wire. Thermal behaviour along the span must still be checked, so treat area matching as a starting point.
Only if the machine has a ribbon-capable bond head, with the correct wedge tool, ribbon guide and cutter for the chosen width. Many heavy-wire platforms offer ribbon heads as an option.
Purity keeps the ribbon soft, so it bonds with less force and ultrasonic energy and is less likely to damage the chip. Micro-alloyed grades are used where better resistance to grain growth at high temperature is worth a slightly narrower process window.
Wear-out under power cycling, seen as heel cracks or cracks that run along the bond interface. Loop design, ribbon softness and the bonding process all affect it, which is why modules are qualified by power cycling before production.
Yes. Send your current width, thickness, material, breaking load, elongation and spool details, and Metline will propose matching material with lot certificates for your qualification.
Send your size, grade, mechanical properties, spool type and quantity. We reply with supply options, documents and delivery terms.